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Question

I'm planning to use IQWorks for some simple MV X-ray field junction QA tests using a Varian amorphous silicon EPID.

Does anybody have a simple explanation of how the various edge detection algorithms work and/or an opinion as to which one would be best?

The default HistThreshCanny? seems to work OK but not sure what it's doing!

Environment

IQWorks version: IQWorks Release 0.5
Server OS: Windows XP
.NET Framework: .NET Framework 2.0
Categories: Analysis Modules

-- JohnSprunt - 22 Jul 2010

Answer

ALERT! If you answer a question - or have a question you asked answered by someone - please remember to edit the page and set the status to answered. The status is in a drop-down list below the edit box.

I've done what I was planning to do using ImageJ? instead - let me know if anyone wants a copy of the macros.

-- JohnSprunt - 10 Jan 2011

 
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Topic revision: r2 - 10 Jan 2011 - 13:58:39 - JohnSprunt
 
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